Abstract

This report covers the Radiation Lot Acceptance Testing (RLAT) results of the SN54SC4T86-SEP radiation tolerant, quadruple 2-input exclusive-OR gates. The study was done to determine Total Ionizing Dose (TID) effects under high dose rate (HDR) to 30 krad(Si). Radiation Lot Acceptance Testing (RLAT) was performed using five units at a dose level of 30 krad(Si) per MIL-STD-883 TM 1019, and all future wafer lots will be tested to the same conditions.

The SN54SC4T86-SEP is packaged in a space enhanced plastic for low outgassing characteristics and is Single Event Latch-Up (SEL) immune up to 43 MeV-cm²/mg, which makes the device an option for low Earth orbit space applications.

For full total ionizing dose characterization results, see SN54SC4T125-SEP Total Ionizing Dose (TID) Report.