The following procedures are used to configure a measurement evaluation with an electronic load. For the following instructions, y = A to D for the A1 to A4 gain variants, respectively.
- According to Figure 4-1, for a low-side measurement, connect the electronic load positive input terminal to the
positive terminal of a 30-A capable hot-supply. For a high-side measurement, connect the
electronic load positive input terminal to the load sourcing terminal (IN+ or IN–) of the
EVM. For high-side measurement of forward current, IN– sources to the electronic load; for
reverse current, IN+ sources to the load.
- Connect the electronic load negative output terminal to the external hot supply GND
terminal for high-side measurements, or to the load sinking terminal of the EVM for
low-side measurements.
- For high-side measurements, connect the
external supply to the load sinking terminal of the EVM. Otherwise, for low-side
measurements, connect the load sourcing terminal of the EVM (IN+ or IN–) to the external
supply gnd.
- Turn on all the connected supplies.
- Apply load with electronic load.
- Measure the output voltage at the VOUT test point.
Note:
The output voltage is equal to an offset
plus the gain of the device multiplied by the load current passing through the leadframe
of the DUT. For bidirectional devices, the offset is the product of the device supply
voltage and 0.5. For unidirectional devices, the offset is the product of the device
supply voltage and 0.1.