SBAK033 February 2025 ADC168M102R-SEP
5 Single-Event Latch-Up Results
During SEL characterization, the device was heated using forced hot air, maintaining the device temperature at 125°C. The temperature was monitored by means of a K-type thermocouple attached as close to the device as possible. The species used for SEL testing was a silver (47Ag) ion with an angle-of-incidence of 0° for an LETEFF = 48MeV-cm2/mg. The kinetic energy in the vacuum for this ion is 1.634GeV (15-MeV/amu line). A flux of approximately 105 ions/s-cm2 and a fluence of approximately 107 ions/cm were used for two runs. The external voltage with the highest recommended voltage setting of 5.5V is applied onboard AVDD connector. The run duration to achieve this fluence was approximately two minutes. As shown in Table 5-1, no SEL events were observed during the exposure of 3 EVM boards completing two runs each. Figure 5-1 shows the current plots during beam exposure.
| Board # | DISTANCE (mm) | TEMPERATURE (°C) | ION | ANGLE |
FLUX (ions × cm2/mg) |
FLUENCE (# ions) |
LETEFF (MeV.cm2/mg) |
|---|---|---|---|---|---|---|---|
|
1 |
40 |
125 |
Ag |
0° | 1.00E+05 | 1.00E+07 |
48 |
|
2 |
40 |
125 |
Ag |
0° | 1.00E+05 | 1.00E+07 |
48 |
|
3 |
40 |
125 |
Ag |
0° | 1.00E+05 | 1.00E+07 |
48 |
No SEL events were observed, indicating that the ADC168M102R-SEP is SEL-immune at LETEFF = 48MeV-cm2/mg and T = 125°C. Using the MFTF method described in Appendix A and combining (or summing) the fluences of the three runs at 125°C (1 × 107), the upper-bound cross section (using a 95% confidence level) is calculated in Equation 1:
where:
- LETEFF = 48 MeV-cm2/mg
- T = 125°C
Figure 5-1 AVDD and DVDD Transients
During Run #1