SLUSDV5B October 2019 – April 2020 UCC5304
PRODUCTION DATA.
| PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
|---|---|---|---|---|---|---|
| tRISE | Output rise time, see Figure 17 | CVDD = 10 µF, COUT = 1.8 nF,
VVDD = 12 V, f = 1 kHz |
5 | 16 | ns | |
| tFALL | Output fall time, see Figure 17 | CVDD = 10 µF, COUT = 1.8 nF ,
VVDD = 12 V, f = 1 kHz |
6 | 12 | ns | |
| tPWmin | Minimum input pulse width that passes to output,
see and |
Output does not change the state if input signal less than tPWmin | 10 | 20 | ns | |
| tPDHL | Propagation delay at falling edge, see | INx high threshold, VINH, to 10% of the output | 28 | 40 | ns | |
| tPDLH | Propagation delay at rising edge, see | INx low threshold, VINL, to 90% of the output | 28 | 40 | ns | |
| tPWD | Pulse width distortion in each channel, see | |tPDLH – tPDHL| | 5.5 | ns | ||
| tVCCI+ to OUT | VCCI Power-up Delay Time: UVLO Rise to OUT,
See Figure 18 |
IN tied to VCCI | 40 | 59 | µs | |
| tVDD+ to OUT | VDD Power-up Delay Time: UVLO Rise to OUT
See Figure 19 |
INtied to VCCI | 22 | 35 | ||
| |CMH| | High-level common-mode transient immunity (See ) | Slew rate of GND vs. VSS, IN is tied to GND or VCCI; VCM=1000 V; | 100 | V/ns | ||
| |CML| | Low-level common-mode transient immunity (See ) | Slew rate of GND vs. VSS, IN is tied to GND or VCCI; VCM=1000 V; | 100 | |||