ZHCSE29A August 2015 – August 2015 UCC27714
PRODUCTION DATA.
| MIN | MAX | UNIT | |||
|---|---|---|---|---|---|
| VIN | Input voltage range | HI, LI, EN(3) with respect to VSS | –5 | 20 | V |
| VDD supply voltage | –0.3 | 20 | V | ||
| HB | –0.3 | 640 | V | ||
| HB-HS | –0.3 | 20 | V | ||
| VOUT | Output voltage range, HO | DC | HS – 0.3 | HB + 0.3 | V |
| Transient, less than 100 ns(4) | HS – 2 | HB + 0.3 | V | ||
| Output voltage range, LO | DC | –0.3 | VDD + 0.3 | V | |
| Transient, less than 100 ns(4) | –2 | VDD + 0.3 | V | ||
| Logic ground, With respect to COM | –7 | 6 | V | ||
| Logic ground, VDD-VSS | –0.3 | 20 | V | ||
| IOUT | Output current, HO, LO, IOUT_PULSED (100 ns) | ±4 | A | ||
| IOUT | Output current, HO, LO, IOUT_DC | 0.25 | A | ||
| dVHS/dt | Allowable offset supply voltage transient | –50 | 50 | V/ns | |
| Lead temperature (soldering, 10 second) | 300 | °C | |||
| TJ | Junction temperature range | –40 | 150 | °C | |
| Tstg | Storage temperature range | -65 | 150 | °C | |
| VALUE | UNIT | ||||
|---|---|---|---|---|---|
| V(ESD)(1) | Electrostatic discharge | Human body model, HBM | ±1400 | V | |
| Charge device model, CDM | ±500 | V | |||
| MIN | NOM | MAX | UNIT | ||
|---|---|---|---|---|---|
| VDD | Supply voltage | 10 | 18 | V | |
| HB-HS | Driver bootstrap voltage | 10 | 18 | V | |
| HS | Source terminal voltage(1) | –8 | 600 | V | |
| HB | Bootstrap pin voltage | HS + 10 | HS + 18 | V | |
| HI, LI, EN | Input voltage with respect to VSS | –4 | 18 | V | |
| VSS | Logic ground | –6(2) | 5(3) | V | |
| TJ | Junction temperature | –40 | 125 | °C | |
| THERMAL METRIC(1) | UCC27714 | UNIT | |
|---|---|---|---|
| D (SOIC) | |||
| PINS | |||
| RθJA | Junction-to-ambient thermal resistance | 72.3 | °C/W |
| RθJC(top) | Junction-to-case (top) thermal resistance | 31.8 | °C/W |
| RθJB | Junction-to-board thermal resistance | 26.5 | °C/W |
| ψJT | Junction-to-top characterization parameter | 3.6 | °C/W |
| ψJB | Junction-to-board characterization parameter | 26.2 | °C/W |
| RθJC(bot) | Junction-to-case (bottom) thermal resistance | N/A | °C/W |
| PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
|---|---|---|---|---|---|---|
| SUPPLY BLOCK | ||||||
| VVDD(on) | turn-on threshold voltage of VDD | 8.4 | 9.1 | 9.8 | V | |
| VVDD(off) | turn-off threshold voltage of VDD | 7.9 | 8.6 | 9.3 | V | |
| VVDD(hys) | Hysteresis of VDD | 0.4 | 0.5 | - | V | |
| VVHB(on) | turn-on threshold voltage of VHB-VHS | 7.7 | 8.3 | 9.0 | V | |
| VVHB(off) | turn-off threshold voltage of VHB-VHS | 6.7 | 7.25 | 8.05 | V | |
| VVHB(hys) | Hysteresis of VHB-VHS | 0.5 | 1.0 | - | V | |
| IQDD | Total quiescent VDD to VSS and COM supply current | HI = LI = 0 V or 5 V, DC on/off state | 750 | 1050 | µA | |
| IQCOM | Quiescent VDD-COM supply current | HI = LI = 0 V or 5 V, DC on/off state | 175 | 350 | µA | |
| IQVSS | Quiescent VDD-VSS supply current | HI = LI = 0 V or 5 V, DC on/off state | 550 | 750 | µA | |
| IQBS | Quiescent HB-HS supply current | HI = 0 V or 5 V, HO in DC on/off state | 120 | 300 | µA | |
| IBL | Bootstrap Supply Leakage Current | HB = HS = 600 V | 20 | µA | ||
| INPUT AND ENABLE BLOCK | ||||||
| VINH, VENH | Input pin (HI or LI) and enable pin (EN) High threshold | 1.7 | 2.3 | 2.7 | V | |
| VINL, VENL | Input pin (HI or LI) and enable pin (EN) low threshold | 1.2 | 1.6 | 2.1 | V | |
| VINHYS, VENHYS | Input pin (HI or LI) and enable pin (EN) threshold hysteresis | 0.7 | V | |||
| IINL | HI, LI input low bias current | HI, LI = 0 V | -5 | 0 | 5 | µA |
| IINH | HI, LI input high bias current | HI, LI = 5 V | 3 | 65 | µA | |
| IENL | EN input low bias current | VEN = 0 V | -90 | -50 | µA | |
| IENH | EN input high bias current | VEN = 5 V | -65 | -25 | µA | |
| RHI | Pull-down resistor on HI input pin | 400 | kΩ | |||
| RLI | Pull-down resistor on LI input pin | 400 | kΩ | |||
| REN | Pull-up resistor on enable pin | 200 | kΩ | |||
| OUTPUT BLOCK | ||||||
| VDD-VLOH | LO output high voltage | LI = 5 V, ILO = –20 mA | 70 | 120 | mV | |
| VHB-VHOH | HO output high voltage | HI = 5 V, IHO = –20 mA | 70 | 120 | mV | |
| VLOL | LO output low voltage | LI = 0 V, ILO = 20 mA | 15 | 35 | mV | |
| VHOL | HO output low voltage | HI = 0 V, IHO = 20 mA | 20 | 40 | mV | |
| RLOL, RHOL (2) | LO, HO output pull down resistance | ILO = 20 mA, IHO = 20 mA | 1.45 | Ω | ||
| RLOH, RHOH | LO, HO output pull up resistance | ILO = –20 mA, IHO= –20 mA | 3.75 | 5.8 | Ω | |
| IGPK- (1) | HO. LO output low short circuit pulsed current | HI = L = 0 V, HO = LO = 15 V, PW < 10 µs | 4 | A | ||
| IGPK+ (1) | HO. LO output high short circuit pulsed current | H I= LI = 5 V, HO = LO = 0 V, PW < 10 µs | 4 | A | ||
| MIN | NOM | MAX | UNIT | ||
|---|---|---|---|---|---|
| DYNAMIC CHARACTERISTICS | |||||
| tPDLH | Turn-on propagation delay, LI to LO, HI to HO, HS = COM = 0 V or HS = 600 V | 90 | 125 | ns | |
| tPDHL | Turn-off propagation delay, LI to LO, HI to HO, HS = COM = 0 V or HS = 600 V | 90 | 125 | ns | |
| tPDRM | Low-to-high delay matching, HS = COM = 0 V | 20 | ns | ||
| tPDFM | High-to-low delay matching, HS = COM = 0 V | 20 | ns | ||
| tRISE | Turn-on rise time, 10% to 90%, HO/LO with 1000-pF load | 15 | 30 | ns | |
| tFALL | Turn-off fall time, 90% to 10%, HO/LO with 1000-pF load | 15 | 30 | ns | |
| tON | Minimum HI/LI ON pulse that changes output state, 0-V to 5-V input signal on HI and LI pins | 100 | ns | ||
| tOFF | Minimum HI/LI OFF pulse that changes output state, 5-V to 0-V input signal on HI and LI pins | 100 | ns | ||
Figure 1. Typical Test Timing Diagram