ZHCSQX4F August 1995 – August 2022 UC1823A , UC1825A , UC2823A , UC2823B , UC2825A , UC2825B , UC3823A , UC3823B , UC3825A , UC3825B
PRODUCTION DATA
- 1特性
- 2說(shuō)明
- 3Revision History
- 4Ordering Information
- 5Pin Configuration and Functions
- 6Specifications
- 7Application and Implementation
- 8Device and Documentation Support
- 9Mechanical, Packaging, and Orderable Information
封裝選項(xiàng)
請(qǐng)參考 PDF 數(shù)據(jù)表獲取器件具體的封裝圖。
機(jī)械數(shù)據(jù) (封裝 | 引腳)
- DW|16
散熱焊盤(pán)機(jī)械數(shù)據(jù) (封裝 | 引腳)
訂購(gòu)信息
7.8 OPEN LOOP TEST CIRCUIT
This test fixture is useful for exercising many functions of this device family and measuring their specifications. As with any wideband circuit, careful grounding and bypass procedures should be followed. The use of a ground plane is highly recommended.
Figure 7-11 Open Loop Test Circuit Schematic