ZHCSP85D november 2021 – august 2023 TPSI3050-Q1
PRODUCTION DATA
- 1
- 1 特性
- 2 應用
- 3 說明
- 4 Revision History
- 5 Pin Configuration and Functions
-
6 Specifications
- 6.1 Absolute Maximum Ratings
- 6.2 ESD Ratings
- 6.3 Recommended Operating Conditions
- 6.4 Thermal Information
- 6.5 Power Ratings
- 6.6 Insulation Specifications
- 6.7 Safety-Related Certifications
- 6.8 Safety Limiting Values
- 6.9 Electrical Characteristics
- 6.10 Switching Characteristics
- 6.11 Insulation Characteristic Curves
- 6.12 Typical Characteristics
- 7 Parameter Measurement Information
- 8 Detailed Description
-
9 Application and Implementation
- 9.1 Application Information
- 9.2
Typical Application
- 9.2.1 Design Requirements
- 9.2.2
Detailed Design Procedure
- 9.2.2.1 Two-Wire or Three-Wire Mode Selection
- 9.2.2.2 Standard Enable, One-Shot Enable
- 9.2.2.3 CDIV1, CDIV2 Capacitance
- 9.2.2.4 RPXFR Selection
- 9.2.2.5 CVDDP Capacitance
- 9.2.2.6 Gate Driver Output Resistor
- 9.2.2.7 Start-up Time and Recovery Time
- 9.2.2.8 Supplying Auxiliary Current, IAUX From VDDM
- 9.2.2.9 VDDM Ripple Voltage
- 9.2.3 Application Curves
- 9.2.4 Insulation Lifetime
- 9.3 Power Supply Recommendations
- 9.4 Layout
- 10Device and Documentation Support
- 11Mechanical, Packaging, and Orderable Information
10.5 靜電放電警告
 |
靜電放電 (ESD) 會損壞這個集成電路。德州儀器 (TI) 建議通過適當的預防措施處理所有集成電路。如果不遵守正確的處理和安裝程序，可能會損壞集成電路。 |
| ESD 的損壞小至導致微小的性能降級，大至整個器件故障。精密的集成電路可能更容易受到損壞，這是因為非常細微的參數更改都可能會導致器件與其發布的規格不相符。 |