6.2 ESD Ratings
|
VALUE |
UNIT |
| V(ESD)(1) |
Electrostatic discharge |
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(2) |
±2000 |
V |
| Charged-device model (CDM), per JEDEC specification JESD22-C101(3) |
±500 |
| IEC61000-4-2 contact discharge, CC1 and CC2(4) |
±8000 |
| IEC61000-4-2 air-gap discharge, CC1 and CC2(4) |
±15000 |
(1) Electrostatic discharge (ESD) to measure device sensitivity/immunity to damage caused by assembly line electrostatic discharges into the device.
(2) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(3) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
(4) Surges per IEC61000-4-2, 1999 applied between CC1/CC2 and output ground of the TPS25820EVM-835.