ZHCSNE0B March 2021 – February 2024 TLIN2029A-Q1
PRODUCTION DATA
- 1
- 1 特性
- 2 應用
- 3 說明
- 4 Pin Configuration and Functions
- 5 Specifications
- 6 Parameter Measurement Information
-
7 Detailed Description
- 7.1 Overview
- 7.2 Functional Block Diagram
- 7.3
Feature Description
- 7.3.1 LIN (Local Interconnect Network) Bus
- 7.3.2 TXD (Transmit Input and Output)
- 7.3.3 RXD (Receive Output)
- 7.3.4 VSUP (Supply Voltage)
- 7.3.5 GND (Ground)
- 7.3.6 EN (Enable Input)
- 7.3.7 Protection Features
- 7.3.8 TXD Dominant Time Out (DTO)
- 7.3.9 Bus Stuck Dominant System Fault: False Wake Up Lockout
- 7.3.10 Thermal Shutdown
- 7.3.11 Under Voltage on VSUP
- 7.3.12 Unpowered Device and LIN Bus
- 7.4 Device Functional Modes
- 8 Application Information Disclaimer
- 9 Device and Documentation Support
- 10Revision History
- 11Mechanical, Packaging, and Orderable Information
封裝選項
機械數據 (封裝 | 引腳)
散熱焊盤機械數據 (封裝 | 引腳)
- DRB|8
訂購信息
6 Parameter Measurement Information
Figure 6-1 Test System: Operating Voltage
Range with RX and TX Access: Parameters 9, 10
Figure 6-2 RX Response: Operating Voltage
Range
Figure 6-3 LIN Bus Input Signal
Figure 6-4 LIN Receiver Test with RX
access Param 17, 18, 19, 20
Figure 6-5 VSUP_NON_OP Param
11
Figure 6-6 Test Circuit for
IBUS_PAS_dom; TXD = Recessive State VBUS = 0 V, Param
13
Figure 6-7 Test Circuit for
IBUS_PAS_rec Param 14
Figure 6-8 Test Circuit for
IBUS_NO_GND Loss of GND
Figure 6-9 Test Circuit for
IBUS_NO_BAT Loss of Battery
Figure 6-10 Test Circuit Slope Control and Duty Cycle
Param 27, 28, 29, 30
Figure 6-11 Definition of Bus Timing
Parameters
Figure 6-12 Propagation Delay Test
Circuit; Param 31, 32
Figure 6-13 Propagation Delay
Figure 6-14 Mode Transitions
Figure 6-15 Wakeup Through EN
Figure 6-16 Wakeup through LIN