ZHCSLG5C July 2020 – March 2022 TLIN2027-Q1
PRODUCTION DATA
- 1 特性
- 2 應(yīng)用
- 3 說明
- 4 Revision History
- 5 說明（續(xù)）
- 6 Pin Configuration and Functions
- 7 Specifications
- 8 Parameter Measurement Information
-
9 Detailed Description
- 9.1 Overview
- 9.2 Functional Block Diagram
- 9.3
Feature Description
- 9.3.1 LIN (Local Interconnect Network) Bus
- 9.3.2 TXD (Transmit Input and Output)
- 9.3.3 RXD (Receive Output)
- 9.3.4 VSUP (Supply Voltage)
- 9.3.5 GND (Ground)
- 9.3.6 EN (Enable Input)
- 9.3.7 Protection Features
- 9.3.8 Bus Stuck Dominant System Fault: False Wake-Up Lockout
- 9.3.9 Thermal Shutdown
- 9.3.10 Under Voltage on VSUP
- 9.3.11 Unpowered Device and LIN Bus
- 9.4 Device Functional Modes
- 10Application and Implementation
- 11Power Supply Recommendations
- 12Layout
- 13Device and Documentation Support
- 14Mechanical, Packaging, and Orderable Information
封裝選項
機(jī)械數(shù)據(jù) (封裝 | 引腳)
散熱焊盤機(jī)械數(shù)據(jù) (封裝 | 引腳)
- DRB|8
訂購信息
8 Parameter Measurement Information
Figure 8-1 Test System: Operating Voltage Range with RX and TX Access: Parameters 9, 10
Figure 8-2 RX Response: Operating Voltage Range
Figure 8-3 LIN Bus Input Signal
Figure 8-4 LIN Receiver Test with RX access Param 17, 18, 19, 20
Figure 8-5 VSUP_NON_OP Param 11
Figure 8-6 Test Circuit for IBUS_LIM at Dominant State (Driver on) Param 12
Figure 8-7 Test Circuit for IBUS_PAS_dom; TXD = Recessive State VBUS = 0 V, Param 13
Figure 8-8 Test Circuit for IBUS_PAS_rec Param 14
Figure 8-9 Test Circuit for IBUS_NO_GND Loss of GND
Figure 8-10 Test Circuit for IBUS_NO_BAT Loss of Battery
Figure 8-11 Test Circuit Slope Control and Duty Cycle Param 27, 28, 29, 30
Figure 8-12 Definition of Bus Timing Parameters
Figure 8-13 Propagation Delay Test Circuit; Param 31, 32
Figure 8-14 Propagation DelayFigure 8-15 Mode Transitions
Figure 8-16 Wake-up Through EN
Figure 8-17 Wake-up through LIN
Figure 8-18 Test Circuit for AC Characteristics