ZHCSKI2B November 2019 – May 2022 TLIN1028S-Q1
PRODUCTION DATA
- 1 特性
- 2 應(yīng)用
- 3 說(shuō)明
- 4 Revision History
- 5 說(shuō)明（續(xù)）
- 6 Pin Configuration and Functions
- 7 Specification
- 8 Parameter Measurement Information
-
9 Detailed Description
- 9.1 Overview
- 9.2 Functional Block Diagram
- 9.3 Feature Description
- 9.4 Device Functional Modes
- 10Application and Implementation
- 11Power Supply Recommendations
- 12Layout
- 13Device and Documentation Support
- 14Mechanical, Packaging, and Orderable Information
封裝選項(xiàng)
機(jī)械數(shù)據(jù) (封裝 | 引腳)
- D|8
散熱焊盤(pán)機(jī)械數(shù)據(jù) (封裝 | 引腳)
訂購(gòu)信息
8.1 Test Circuit: Diagrams and Waveforms
Figure 8-1 Test System: Operating Voltage Range with RX and TX Access
Figure 8-2 RX Response: Operating Voltage Range
Figure 8-3 LIN Bus Input Signal
Figure 8-4 LIN Receiver Test with RX access
Figure 8-5 Test Circuit for IBUS_LIM at Dominant State (Driver on)
Figure 8-6 Test Circuit for IBUS_PAS_dom; TXD = Recessive State VBUS = 0 V
Figure 8-7 Test Circuit for IBUS_PAS_rec
Figure 8-8 Test Circuit for IBUS_NO_GND Loss of GND
Figure 8-9 Test Circuit for IBUS_NO_BAT Loss of Battery
Figure 8-10 Test Circuit Slope Control and Duty Cycle
Figure 8-11 Definition of Bus Timing
Figure 8-12 Propagation Delay Test Circuit
Figure 8-13 Propagation Delay
Figure 8-14 Mode Transitions
Figure 8-15 Wakeup Through EN
Figure 8-16 Wakeup through LIN
Figure 8-17 Test Circuit for AC Characteristics