ZHCSLG4B July 2020 – May 2022 TLIN1027-Q1
PRODUCTION DATA
- 1 特性
- 2 應用
- 3 說明
- 4 Revision History
- 5 Pin Configuration and Functions
- 6 Specifications
- 7 Parameter Measurement Information
-
8 Detailed Description
- 8.1 Overview
- 8.2 Functional Block Diagram
- 8.3
Feature Description
- 8.3.1 LIN (Local Interconnect Network) Bus
- 8.3.2 TXD (Transmit Input and Output)
- 8.3.3 RXD (Receive Output)
- 8.3.4 VSUP (Supply Voltage)
- 8.3.5 GND (Ground)
- 8.3.6 EN (Enable Input)
- 8.3.7 Protection Features
- 8.3.8 Bus Stuck Dominant System Fault: False Wake-Up Lockout
- 8.3.9 Thermal Shutdown
- 8.3.10 Under Voltage on VSUP
- 8.3.11 Unpowered Device and LIN Bus
- 8.4 Device Functional Modes
- 9 Application and Implementation
- 10Power Supply Recommendations
- 11Layout
- 12Device and Documentation Support
- 13Mechanical, Packaging, and Orderable Information
封裝選項
機械數據 (封裝 | 引腳)
散熱焊盤機械數據 (封裝 | 引腳)
- DRB|8
訂購信息
7 Parameter Measurement Information
Figure 7-1 Test System: Operating Voltage Range with RX and TX Access: Parameters 9, 10
Figure 7-2 RX Response: Operating Voltage Range
Figure 7-3 LIN Bus Input Signal
Figure 7-4 LIN Receiver Test with RX access Param 17, 18, 19, 20
Figure 7-5 VSUP_NON_OP Param 11
Figure 7-6 Test Circuit for IBUS_LIM at Dominant State (Driver on) Param 12
Figure 7-7 Test Circuit for IBUS_PAS_dom; TXD = Recessive State VBUS = 0 V, Param 13
Figure 7-8 Test Circuit for IBUS_PAS_rec Param 14
Figure 7-9 Test Circuit for IBUS_NO_GND Loss of GND
Figure 7-10 Test Circuit for IBUS_NO_BAT Loss of Battery
Figure 7-11 Test Circuit Slope Control and Duty Cycle Param 27, 28, 29, 30
Figure 7-12 Definition of Bus Timing Parameters
Figure 7-13 Propagation Delay Test Circuit; Param 31, 32
Figure 7-14 Propagation DelayFigure 7-15 Mode Transitions
Figure 7-16 Wake-up Through EN
Figure 7-17 Wake-up through LIN
Figure 7-18 Test Circuit for AC Characteristics