SLVS004I April 1979 – August 2016 TL317
PRODUCTION DATA.
- 1 Features
- 2 Applications
- 3 Description
- 4 Revision History
- 5 Pin Configuration and Functions
- 6 Specifications
- 7 Detailed Description
-
8 Application and Implementation
- 8.1 Application Information
- 8.2
Typical Applications
- 8.2.1 Adjustable Voltage Regulator
- 8.2.2 0-V to 30-V Regulator Circuit
- 8.2.3 Regulator Circuit With Improved Ripple Rejection
- 8.2.4 Precision Current-Limiter Circuit
- 8.2.5 Tracking Preregulator Circuit
- 8.2.6 Slow-Turnon 15-V Regulator Circuit
- 8.2.7 50-mA Constant-Current Battery-Charger Circuit
- 8.2.8 Current-Limited 6-V Charger
- 8.2.9 High-Current Adjustable Regulator
- 9 Power Supply Recommendations
- 10Layout
- 11Device and Documentation Support
- 12Mechanical, Packaging, and Orderable Information
封裝選項
機械數據 (封裝 | 引腳)
散熱焊盤機械數據 (封裝 | 引腳)
- PS|8
訂購信息
6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)| MIN | MAX | UNIT | ||
|---|---|---|---|---|
| Input-to-output differential voltage, Vl – VO | 35 | V | ||
| Operating virtual-junction temperature, TJ | 150 | °C | ||
| Storage temperature range, Tstg | –65 | 150 | °C | |
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
6.2 ESD Ratings
| VALUE | UNIT | |||
|---|---|---|---|---|
| V(ESD) | Electrostatic discharge | Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) | ±2000 | V |
| Charged-device model (CDM), per JEDEC specification JESD22-C101(2) | ±1000(3) | |||
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
(3) Tested on PW package.
6.3 Recommended Operating Conditions
| MIN | NOM | MAX | UNIT | |||
|---|---|---|---|---|---|---|
| VI – VO | Input-to-output voltage differential | 2.5 | 35 | V | ||
| IO | Output current | 2.5 | 100 | mA | ||
| TJ | Operating virtual-junction temperature | TL317C | 0 | 125 | °C | |
| TL317 | –40 | 125 | °C | |||
6.4 Thermal Information
| THERMAL METRIC(1) | TL317 | UNIT | ||||
|---|---|---|---|---|---|---|
| D (SOIC) | PW (TSSOP) | PS (SOP) | LP (TO-92) | |||
| 8 PINS | 8 PINS | 8 PINS | 3 PINS | |||
| RθJA | Junction-to-ambient thermal resistance | 109.9 | 170 | 115.3 | 157.9 | °C/W |
| RθJC(top) | Junction-to-case (top) thermal resistance | 58.8 | 51 | 67.1 | 81.6 | °C/W |
| RθJB | Junction-to-board thermal resistance | 58.5 | 101.5 | 64.4 | — | °C/W |
| ψJT | Junction-to-top characterization parameter | 12.5 | 3.7 | 27.7 | 25.4 | °C/W |
| ψJB | Junction-to-board characterization parameter | 57.9 | 99.1 | 63.5 | 137.1 | °C/W |
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report.
6.5 Electrical Characteristics
over recommended operating virtual-junction temperature range (unless otherwise noted)(1)| PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
|---|---|---|---|---|---|---|
| Input voltage regulation(2) | VI – VO = 5 V to 35 V | TJ = 25°C | 0.01% | 0.02% | V | |
| IO = 2.5 mA to 100 mA | 0.02% | 0.05% | ||||
| Ripple regulation | VO = 10 V, f = 120 Hz | 65 | dB | |||
| VO = 10 V, 10-µF capacitor between ADJUSTMENT and ground |
66 | 80 | ||||
| Output voltage regulation | VI = 5 V to 35 V, IO = 2.5 mA to 100 mA, TJ = 25°C |
VO ≤ 5 V | 25 | mV | ||
| VO ≥ 5 V | 5 | mV/V | ||||
| VI = 5 V to 35 V, IO = 2.5 mA to 100 mA |
VO ≤ 5 | 50 | mV | |||
| VO ≥ 5 V | 10 | mV/V | ||||
| Output voltage change with temperature | TJ = 0°C to 125°C | 10 | mV/V | |||
| Output voltage long-term drift | After 1000 hours at TJ = 125°C and VI – VO = 35 V | 3 | 10 | mV/V | ||
| Output noise voltage | f = 10 Hz to 10 kHz, TJ = 25°C | 30 | µV/V | |||
| Minimum output current to maintain regulation | VI – VO = 35 | 1.5 | 2.5 | mA | ||
| Peak output current | VI – VO ≤ 35 V | 100 | 200 | mA | ||
| ADJUSTMENT current | 50 | 100 | µA | |||
| Change in ADJUSTMENT current | VI – VO = 2.5 V to 35 V, IO = 2.5 mA to 100 mA | 0.2 | 5 | µA | ||
| Reference voltage (output to ADJUSTMENT) |
IO = 2.5 mA to 100 mA, VI − VO = 5 V to 35 V, P ≤ rated dissipation |
1.2 | 1.25 | 1.3 | V | |
(1) Unless otherwise noted, these specifications apply for the following test conditions: VI – VO = 5 V and IO = 40 mA. Pulse-testing techniques must be used that maintain the junction temperature as close to the ambient temperature as possible. All characteristics are measured with a 0.1-µF capacitor across the input and a 1-µF capacitor across the output.
(2) Input voltage regulation is expressed here as the percentage change in output voltage per 1-V change at the input.
6.6 Typical Characteristic
Figure 1. Dropout Voltage vs Load Current (TJ = 25°C)