ZHCSX73C August 2006 – October 2024
PRODUCTION DATA
- 1
- 1 特性
- 2 應用
- 3 說明
- 4 Pin Configuration and Functions
-
5 Specifications
- 5.1 Absolute Maximum Ratings
- 5.2 ESD Ratings
- 5.3 Recommended Operating Conditions
- 5.4 Thermal Information
- 5.5 Reference Section Electrical Characteristics
- 5.6 Oscillator Section Electrical Characteristics
- 5.7 Error-Amplifier Section Electrical Characteristics
- 5.8 Current-Sense Section Electrical Characteristics
- 5.9 Output Section Electrical Characteristics
- 5.10 Undervoltage-Lockout Section Electrical Characteristics
- 5.11 Pulse-Width Modulator Section Electrical Characteristics
- 5.12 Supply Voltage Electrical Characteristics
- 5.13 Typical Characteristics
- 6 Detailed Description
- 7 Application and Implementation
- 8 Device and Documentation Support
- 9 Revision History
- 10Mechanical, Packaging, and Orderable Information
封裝選項
機械數據 (封裝 | 引腳)
散熱焊盤機械數據 (封裝 | 引腳)
訂購信息
7.3 Open-Loop Laboratory Test Fixture
In the open-loop laboratory test fixture (see Figure 7-6), high peak currents associated with loads necessitate careful grounding techniques. Timing and bypass capacitors should be connected close to the GND terminal in a single-point ground. The transistor and 5-k? potentiometer sample the oscillator waveform and apply an adjustable ramp to the ISENSE terminal.
Figure 7-6 Open-Loop Laboratory Test Fixture