ZHCSRD4I July 2003 – January 2023 SN65HVD1176 , SN75HVD1176
PRODUCTION DATA
- 1 特性
- 2 應(yīng)用
- 3 說明
- 4 Revision History
- 5 Pin Configuration and Functions
- 6 Specifications
- 7 Detailed Description
- 8 Application and Implementation
- 9 Power Supply Recommendations
- 10Layout
- 11Device and Documentation Support
- 12Mechanical, Packaging, and Orderable Information
封裝選項(xiàng)
機(jī)械數(shù)據(jù) (封裝 | 引腳)
- D|8
散熱焊盤機(jī)械數(shù)據(jù) (封裝 | 引腳)
訂購信息
Parameter Measurement Information
Note:
Test load capacitance includes probe and jig capacitance (unless otherwise specified).
Signal generator characteristics: rise and fall time < 6 ns, pulse rate 100 kHz, 50% duty cycle, Zo = 50 ? (unless otherwise specified).
Figure 7-1 Driver Test Circuit, VOD and VOC Without Common-Mode Loading
Figure 7-2 Driver Test Circuit, VOD With Common-Mode Loading
Figure 7-3 Driver Switching Test Circuit and Rise/Fall Time Measurement
Figure 7-4 Driver Switching Waveforms for Propagation Delay and Output Midpoint Time Measurements
Figure 7-5 Driver VOC Test Circuit and Waveforms
A. VOD(RING) is measured at four points on the output waveform, corresponding to overshoot and undershoot from the VOD(H) and VOD(L) steady state values.
Figure 7-6 VOD(RING) Waveform and Definitions
Figure 7-7 Driver Enable/Disable Test
Figure 7-8 Driver Short-Circuit Test Circuit and Waveforms (Short Circuit applied at Time t = 0)
Figure 7-9 Receiver DC Parameter Definitions
Figure 7-10 Receiver Switching Test Circuit and Waveforms
Figure 7-11 Receiver Common-Mode Rejection Test Circuit
Figure 7-12 Receiver Enable Time From Standby (Driver Disabled)
Figure 7-13 Receiver Enable Test Circuit and Waveforms, Data Output High (Driver Active)
Figure 7-14 Receiver Enable Test Circuit and Waveforms, Data Output Low (Driver Active)
Figure 7-15 Test Circuit and Waveforms, Transient Overvoltage Test