ZHCSP38C October 2008 – April 2022 SN54AC00-SP
PRODUCTION DATA
- 1特性
- 2應用
- 3說明
- 4Revision History
- 5Bare Die Information
- 6Specifications
- 7Parameter Measurement Information
- 8Device and Documentation Support
- 9Mechanical, Packaging, and Orderable Information
封裝選項
機械數據 (封裝 | 引腳)
散熱焊盤機械數據 (封裝 | 引腳)
訂購信息
8.4 Electrostatic Discharge Caution
 |
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. |
| ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. |