SBOS392H August 2007 – August 2019 REF3312 , REF3318 , REF3320 , REF3325 , REF3330 , REF3333
PRODUCTION DATA.
- 1 Features
- 2 Applications
- 3 Description
- 4 Revision History
- 5 Device Comparison
- 6 Pin Configuration and Functions
- 7 Specifications
- 8 Parameter Measurement Information
- 9 Detailed Description
-
10Applications and Implementation
- 10.1 Application Information
- 10.2
Typical Applications
- 10.2.1
REF3312 in a Bipolar Signal-Chain Configuration
- 10.2.1.1 Design Requirements
- 10.2.1.2 Detailed Design Procedure
- 10.2.1.3 Application Curves
- 10.2.1
REF3312 in a Bipolar Signal-Chain Configuration
- 11Power-Supply Recommendations
- 12Layout
- 13Device and Documentation Support
- 14Mechanical, Packaging, and Orderable Information
封裝選項
機械數(shù)據(jù) (封裝 | 引腳)
散熱焊盤機械數(shù)據(jù) (封裝 | 引腳)
訂購信息
13.6 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.