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ZHCSD60D June 2012 – August 2018 LMZ20502

PRODUCTION DATA.

封裝選項

請參考 PDF 數據表獲取器件具體的封裝圖。

機械數據 (封裝 | 引腳)

SIL|8

散熱焊盤機械數據 (封裝 | 引腳)

訂購信息

6.5 Electrical Characteristics

Limits apply over the recommended operating junction temperature range of –40°C to 125°C, unless otherwise noted. Minimum and maximum limits are verified through test, design, or statistical correlation. Typical values represent the most likely parametric norm at T_J = 25°C, and are provided for reference purposes only. Unless otherwise stated the following conditions apply: V_IN = 3.6 V

PARAMETER		TEST CONDITIONS	MIN⁽¹⁾	TYP	MAX⁽¹⁾	UNIT
V_FB	Feedback voltage	V_IN = 3.6 V	0.594	0.6	0.606	V
I_{Q_AUTO}	Operating quiescent current in AUTO mode	AUTO mode, V_FB = 0.8V		72	90	µA
I_{Q_PWM}	Operating quiescent current in forced PWM mode	PWM mode, V_FB = 0.8V		490	620	µA
I_{Q_off}	Shutdown quiescent current⁽²⁾	V_IN = 3.6 V, V_EN = 0.0 V		0.7	1.5	µA
I_{Q_off}	Shutdown quiescent current⁽²⁾	V_IN = 5.5 V, V_EN = 0.0 V		1.0	2.4	µA
V_UVLO	Input supply under-voltage lock-out thresholds	Rising		2.5		V
V_UVLO	Input supply under-voltage lock-out thresholds	Falling		2.3		V
V_EN	High Level Input Voltage	V_IH	1.4			V
V_EN	Low Level Input Voltage	V_IL			0.4	V
V_MODE	High Level Input Voltage	V_IH	1.2			V
V_MODE	Low Level Input Voltage	V_IL			0.4	V
I_LIM	Peak switch current limit⁽³⁾		2.1	2.7		A
F_osc	Internal oscillator frequency		2.5	3.0	3.2	MHz
T_ON	Minimum switch on-time⁽⁵⁾			50		ns
T_ss	Soft start time⁽⁵⁾			800		µs
R_PG	Power good flag pull-down R_dson		40	70	110	Ω
V_PG1	Power good flag, under-voltage trip⁽⁴⁾	% of feedback voltage, rising		92%
V_PG2	Power good flag, under-voltage trip⁽⁴⁾	% of feedback voltage, falling		88%
V_PG3	Power good flag, over-voltage trip⁽⁴⁾	% of feedback voltage, rising		112%
V_PG4	Power good flag, over-voltage trip⁽⁴⁾	% of feedback voltage, falling		108%
T_SD	Thermal shutdown⁽⁵⁾	Rising threshold		159		°C
T_SD	Thermal shutdown hysteresis⁽⁵⁾			15		°C

(1) MIN and MAX limits are 100% production tested at 25°C. Limits over the operating temperature range are verified through correlation using Statistical Quality Control (SQC) methods. Limits are used to calculate Average Outgoing Quality Level (AOQL).

(2) Shutdown current includes leakage current of the switching transistors.

(3) This is the peak switch current limit measured with a slow current ramp. Due to inherent delays in the current limit comparator, the peak current limit measured at 3MHz will be larger.

(4) See Power Good Flag Function for explanation of voltage levels.

(5) This parameter is not tested in production.