ZHCSOQ8A August 2021 – October 2021 LM5158-Q1 , LM51581-Q1
PRODUCTION DATA
- 1 特性
- 2 應用
- 3 說明
- 4 Revision History
- 5 說明（續）
- 6 Device Comparison Table
- 7 Pin Configuration and Functions
- 8 Specifications
-
9 Detailed Description
- 9.1 Overview
- 9.2 Functional Block Diagram
- 9.3
Feature Description
- 9.3.1 Line Undervoltage Lockout (EN/UVLO/SYNC Pin)
- 9.3.2 High Voltage VCC Regulator (BIAS, VCC Pin)
- 9.3.3 Soft Start (SS Pin)
- 9.3.4 Switching Frequency (RT Pin)
- 9.3.5 Dual Random Spread Spectrum – DRSS (MODE Pin)
- 9.3.6 Clock Synchronization (EN/UVLO/SYNC Pin)
- 9.3.7 Current Sense and Slope Compensation
- 9.3.8 Current Limit and Minimum On Time
- 9.3.9 Feedback and Error Amplifier (FB, COMP Pin)
- 9.3.10 Power-Good Indicator (PGOOD Pin)
- 9.3.11 Hiccup Mode Overload Protection (MODE Pin)
- 9.3.12 Maximum Duty Cycle Limit and Minimum Input Supply Voltage
- 9.3.13 Internal MOSFET (SW Pin)
- 9.3.14 Overvoltage Protection (OVP)
- 9.3.15 Thermal Shutdown (TSD)
- 9.4 Device Functional Modes
- 10Application and Implementation
- 11Power Supply Recommendations
- 12Layout
- 13Device and Documentation Support
- 14Mechanical, Packaging, and Orderable Information
13.6 Electrostatic Discharge Caution
 |
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. |
| ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. |