4 修訂歷史記錄
Changes from C Revision (February 2017) to D Revision
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無技術(shù)更改，僅限編輯 Go
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Replace Handling Ratings with ESD Ratings per latest TI data sheet standardsGo
Changes from B Revision (September 2014) to C Revision
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Added 全新 VSON 封裝Go
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Added New Package Drawing Go
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Added New VSON PinoutGo
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Changed BIAS Pin Abs Max Go
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Changed PGOOD resistance values on EC TableGo
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Updating Figure 19 EN Falling ThresholdGo
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Updating Figure 20 EN Rising ThresholdGo
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Updating Figure 21 EN HysteresisGo
Changes from A Revision (April 2014) to B Revision
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Changed Figure 33 into conducted EMI CurveGo
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Added Equation 25Go
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Added Equation 26Go
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Added Figure 73 to Figure 78. Application Performance Curves for VOUT = 5 V, Fs = 500 kHz. Go
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Changed Figure 86Go
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Changed Figure 87 Go
Changes from * Revision (April 2014) to A Revision
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Changed 將器件狀態(tài)從產(chǎn)品預(yù)覽更改為生產(chǎn)數(shù)據(jù)Go