4 Revision History

Changes from H Revision (May 2013) to I Revision

• VDE standard changed to DIN V VDE V 0884-10 (VDE V 0884-10):2006-12 Go
• Added Pin Configuration and Functions section, ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section Go

Changes from G Revision (May 2013) to H Revision

• Changed Feature From: 4~242 Vpeak Isolation To: 4242 Vpeak IsolationGo

Changes from F Revision (January 2013) to G Revision

• Changed V_IORM in the INSULATION CHARACTERISTICS table, Specification value From: 56~6 To: 566Go
• Changed V_PR in the Specification value From: 10~62 To: 1062Go
• Changed V_IOTM t = 60 s (qualification) Specification value From: 4~242 To: 4242Go

Changes from E Revision (June 2011) to F Revision

• Changed Feature From: 242 Vpeak Maximum Isolation-per DIN EN 60747-5-2 (VDE 0884 Part 2) - To: 4~242 Vpeak IsolationGo
• Changed Feature From: IEC/VDE and CSA Approvals, IEC 60950-1–IEC 61010-1 End Equipment Standards Approvals, All Approvals Pending To: CSA 60950-1 and IEC 61010-1 ApprovedGo
• Added table Note to V_IORMGo
• Changed V_IORM in the INSULATION CHARACTERISTICS table, Specification value From: 56~0 To: 56~6Go
• Changed V_PR in the Specification value From: 10~50 To: 10~62Go
• Changed V_IOTM t = 60 s (qualification) Specification value From: 4~000 To: 4~242Go
• Changed the IEC 60664-1 RATINGS TABLE. Row - Basic isolation group SPECIFICATION From: III-a To: IIGo
• Changed CTI in the PACKAGE CHARACTERISTICS table, Min value From: >175 To 400Go
• Changed the text of NOTE: Go
• Changed the REGULATORY INFORMATION tableGo

Changes from D Revision (July 2010) to E Revision

• Added new fifth bullet to Features and deleted text from 4-kVpeak bullet itemGo
• Changed first paragraph in Description from: ISO7420M, ISO7421, and ISO7421M to: ISO7420M and ISO7421Go
• Changed ISO742xM in the ELEC CHAR and SWITCHING CHAR table to ISO7420MGo
• Changed ISO742xM in the ELEC CHAR and SWITCHING CHAR table to ISO7420MGo
• Changed ISO742xM in the ELEC CHAR and SWITCHING CHAR table to ISO7420MGo
• Changed ISO742xM in the ELEC CHAR and SWITCHING CHAR table to ISO7420MGo
• Changed the MAX value in the SWITCHING CHAR table 2nd row from 3.5 to 3.7 and 3rd row from 4 to 4.9Go
• Changed the MAX value in the 2nd SWITCHING CHAR table 2nd row from 4 to 5.6 and 3rd row from 5 to 6.3Go
• Changed the MAX value in the 3rd SWITCHING CHAR table 3rd row from 5 to 8.5 Go
• Changed the MAX value in the 4rd SWITCHING CHAR table 3rd row from 6 to 6.8 Go
• Changed Regulatory Information table last row, last column from: pending (E181974) to: E181974Go
• Changed Note 2 in Function Table from: ISO7420M, ISO7421, and ISO7421M to: ISO7420M and ISO7421Go

Changes from C Revision (March 2010) to D Revision

• Updated the Features ListGo
• Deleted devices ISO7420F and ISO7420FM from the data sheetGo
• Updated the device Description. Add paragraph - Note: The ISO7420 and ISO7421Go
• Added Tstg to the Absolute Maximum Ratings TableGo
• Updated the Recommended Operating Conditions tableGo
• Updates throughout the Electrical Characteristics and Switching Characteristics tablesGo
• Updated the Supply Current test conditionsGo
• Deleted the SUPPLY CURRENT vs SIGNAL RATE (ALL CHANNELS) graphs and the EYE DIAGRAM plotsGo
• Changed Figure 7Go
• Changed the V_IORM, V_PR, and V_IOTM unit values From: V To: VpeakGo
• Changed Minimum internal gap MIN value From: 0.008 To: 0.014mmGo
• Changed the Barrier capacitance, input to output test conditionsGo
• Changed the Input capacitance test conditions Go
• Changed V_I From: 5.5 V To: 5.25 VGo
• Changed From: 107mA To: 112mAGo
• Changed V_I From: 3.6 V To: 3.45 VGo
• Changed From: 164mA To: 171mAGo
• Changed Figure 10Go
• Deleted the I_CC equations sectionGo
• Changed the Function Table Output values for PU (Open) From: H/L To: HGo
• Changed Figure 11Go

Changes from B Revision (February 2010) to C Revision

• Added devices ISO7420F and ISO7420FM to the data sheetGo
• Added The suffix M indicates wide temperature range (–55°C to 125°C) and the suffix F indicates output-low option in fail-safe condition. All other devices without the F suffix default to output-high in fail-safe state.Go
• Added ISO7420F and ISO7420FM to the Available Options TableGo
• Changed value from a max of 4 mA to a min of –4 mAGo
• Changed value from a min of –4 mA to a max of 4 mA Go
• Changed Electrical Characteristics ConditionsGo
• Deleted C_i from the ELECTRICAL CHARACTERISTICSGo
• Added (All inputs switching with square wave clock signal for dynamic ICC measurement)Go
• Changed ELECTRICAL CHARACTERISTICS conditionsGo
• Added High-level output voltage ISO7420 / 7421 (3.3-V side) test condition Go
• Changed High-level output voltage min valueGo
• Deleted C_I specificationGo
• Added (All inputs switching with square wave clock signal for dynamic ICC measurement)Go
• Changed ELECTRICAL CHARACTERISTICS conditionsGo
• Added High-level output voltage ISO7420 / 7421 (5-V side) test conditionGo
• Changed High-level output voltage min valueGo
• Deleted C_I specificationGo
• Added (All inputs switching with square wave clock signal for dynamic ICC measurement)Go
• Changed ELECTRICAL CHARACTERISTICS conditionsGo
• Deleted C_I specificationGo
• Added (All inputs switching with square wave clock signal for dynamic ICC measurement)Go
• Changed SWITCHING CHARACTERISTICS conditionsGo
• Changed PWD parameter from duration to widthGo
• Changed Switching Characteristics conditionsGo
• Changed Pulse duration distortion to Pulse width distortion Go
• Changed SWITCHING CHARACTERISTICS conditionsGo
• Changed Pulse duration distortion to Pulse width distortion Go
• Changed SWITCHING CHARACTERISTICS conditionsGo
• Changed Pulse duration distortion to Pulse width distortionGo
• Changed Figure 7Go
• Added input to output and note 1 to Isolation resistance, input to outputGo
• Changed the Isolation resistance test conditionsGo
• Changed the Isolation resistance test conditionsGo
• Added note 1 to Barrier capacitance, input to outputGo
• Added Input capacitanceGo
• Changed T_J = 170°C to T_J = 150°CGo
• Changed From: 124mA To: 107mAGo
• Changed T_J = 170°C to T_J = 150°CGo
• Changed From: 190mA To: 164mAGo
• Changed Figure 10Go
• Changed the Function Table Output values for PU (Open) From: H To: H/LGo
• Changed the Function Table Output values for PU (X) From: H To: H/LGo
• Changed the Function Table Output values for PU (X) From: H/L To: HGo
• Added Note (2) in the Function TableGo
• Changed Figure 11Go

Changes from A Revision (December 2009) to B Revision

• Switching Characteristics Table, Added Note (2) - Typical specifications are measured at ideal conditions of 25°C. Max or Min specifications are measured at worst case conditions for V_CC and temperature.Go

Changes from * Revision (June 2009) to A Revision

• Added devices ISO7420 and ISO7420M to the data sheetGo
• Added the I_CC equations sectionGo