SLVAES3C May 2020 – October 2020 TPS61378-Q1
1 Overview
This document contains information for TPS61378-Q1, TPS613781-Q1, TPS613782-Q1, TPS613783-Q1, TPS613784-Q1, TPS613785-Q1(VQFN package) to aid in a functional safety system design. Information provided are:
- Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
- Component failure modes and their distribution (FMD) based on the primary function of the device
- Pin failure mode analysis (Pin FMA)
Figure 1-1 shows the device functional block diagram for reference.
Figure 1-1 Functional Block
DiagramTPS61378-Q1, TPS613781-Q1, TPS613782-Q1, TPS613783-Q1, TPS613784-Q1, TPS613785-Q1 were developed using a quality-managed development process, but were not developed in accordance with the IEC 61508 or ISO 26262 standards.