The test points on the board can be used for
connecting to the input of a power supply and output load for the EVM. See Figure 1-1 for typical test setup. The functions of the test points connections are:
VIN_EMI — Input supply to EVM including an EMI filter. Connect to a
suitable input supply. Connect at this point for EMI test.
GND_EMI — Ground connection for the input supply
VIN — Input supply to the IC. Can be connected to DMM to measure input
voltage after EMI filter.
VOUT — Output voltage test point of EVM. Can be connected to a desired
load.
GND — Ground test points
EN — This test point is connected to the EN pin. By default, there is a
pullup resistor, R1 (RENT), to VIN to enable the IC.
PGOOD — This test point is connected to the PGOOD pin from the IC. Can be
tied to an external supply through a pullup resistor or left open.
SYNC — In a MODE/SYNC trim part, this test point is connected to
the SYNC pin of the IC. This test point can also be connected to an external
clock to synchronize the IC. Make sure R9 (RJM) is installed and R8 (RSYNC) is
not installed when applying a sync clock input.