SFFS759 February 2024 CD4051B-Q1
4.1 CD4051B-Q1 TSSOP Package
Figure 4-1 shows the CD4051B-Q1 pin diagram for the TSSOP package. For a detailed description of the device pins, see the Pin Configuration and Functions section in the CD405xB-Q1 data sheet.
Figure 4-1 Pin Diagram (TSSOP) PackageTable 4-2 Pin FMA for Device Pins Short-Circuited to Ground
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| CH 4 IN/OUT | 1 | Corruption of analog signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, device damage is possible. |
A |
|
CH 6 IN/OUT |
2 | Corruption of analog signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, device damage is possible. |
A |
| COM OUT/IN | 3 | Corruption of analog signal passed onto the CHx IN/OUT pins. If there is no limiting resistor in the switch path, device damage is possible. |
A |
| CH 7 IN/OUT | 4 | Corruption of analog signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, device damage is possible. |
A |
| CH 5 IN/OUT | 5 | Corruption of analog signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, device damage is possible. |
A |
| INH | 6 | INH stuck low. Cannot control switch states. | B |
| VEE | 7 | There is no effect; this is normal operation, if the switch path signal voltages are positive. Possible damage to the device if the switch path signal voltages are negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. | A |
| VSS | 8 | There is no effect; this is normal operation. |
D |
C | 9 | Control of the address pin is lost. Cannot control switch. | B |
B | 10 | Control of the address pin is lost. Cannot control switch. | B |
A | 11 | Control of the address pin is lost. Cannot control switch. | B |
| CH 3 IN/OUT | 12 | Corruption of analog signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, device damage is possible. | A |
| CH 0 IN/OUT | 13 | Corruption of analog signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, device damage is possible. | A |
| CH 1 IN/OUT | 14 | Corruption of analog signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, device damage is possible. | A |
| CH 2 IN/OUT | 15 | Corruption of analog signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, device damage is possible. | A |
| VDD | 16 | Device unpowered. Device not functional. | A |
Table 4-3 Pin FMA for Device Pins Open-Circuited
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| CH 4 IN/OUT | 1 | Corruption of analog signal passed onto the COM OUT/IN pin. | B |
CH 6 IN/OUT | 2 | Corruption of analog signal passed onto the COM OUT/IN pin. | B |
| COM OUT/IN | 3 | Corruption of analog signal passed onto the CHx IN/OUT pins. | B |
| CH 7 IN/OUT | 4 | Corruption of analog signal passed onto the COM OUT/IN pin. | B |
| CH 5 IN/OUT | 5 | Corruption of analog signal passed onto the COM OUT/IN pin. | B |
| INH | 6 | Loss of control of INH pin. Cannot disable switch. Will default to switches enabled. | B |
| VEE | 7 | Device unpowered. Device not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. | A |
| VSS | 8 | Device unpowered. Device not functional. | B |
| C | 9 | Control of the address pin is lost. Cannot control switch. | B |
| B | 10 | Control of the address pin is lost. Cannot control switch. | B |
| A | 11 | Control of the address pin is lost. Cannot control switch. | B |
| CH 3 IN/OUT | 12 | Corruption of analog signal passed onto the COM OUT/IN pin. | B |
| CH 0 IN/OUT | 13 | Corruption of analog signal passed onto the COM OUT/IN pin. | B |
| CH 1 IN/OUT | 14 | Corruption of analog signal passed onto the COM OUT/IN pin. | B |
| CH 2 IN/OUT | 15 | Corruption of analog signal passed onto the COM OUT/IN pin. | B |
| VDD | 16 | Device unpowered. Device not functional. | B |
Table 4-4 Pin FMA for Device Pins Short-Circuited to Adjacent Pin
| Pin Name | Pin No. | Shorted To | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|---|
| CH 4 IN/OUT | 1 | CH 6 IN/OUT | Possible corruption of analog signal passed onto CHx and COM pin. | B |
| CH 6 IN/OUT | 2 | COM OUT/IN | Possible corruption of analog signal passed onto CHx and COM pin. | B |
| COM OUT/IN | 3 | CH 7 IN/OUT | Possible corruption of analog signal passed onto CHx and COM pin. | B |
| CH 7 IN/OUT | 4 | CH 5 IN/OUT | Possible corruption of analog signal passed onto CHx and COM pin. | B |
| CH 5 IN/OUT | 5 | INH | Possible corruption of the signal passed onto the D pin. Switch state will be undefined. | B |
| INH | 6 | VEE | Possible damage to device if the signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. | A |
| VEE | 7 | VSS | Possible damage to device if the signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. | A |
| VSS | 8 | C | Not considered, corner pin. | D |
| C | 9 | B | Control of the switch state is lost. | B |
| B | 10 | A | Control of the switch state is lost. | B |
| A | 11 | CH 3 IN/OUT | Possible corruption of the signal passed onto the CHx and COM pin. Control of the switch state is lost. | B |
| CH 3 IN/OUT | 12 | CH 0 IN/OUT | Possible corruption of the signal passed onto the CHx and COM pin. | B |
| CH 0 IN/OUT | 13 | CH 1 IN/OUT | Possible corruption of the signal passed onto the CHx and COM pin. | B |
| CH 1 IN/OUT | 14 | CH 2 IN/OUT | Possible corruption of the signal passed onto the CHx and COM pin. | B |
| CH 2 IN/OUT | 15 | VDD | Corruption of the signal passed onto the CHx pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| VDD | 16 | CH 4 IN/OUT | Not considered, corner pin. | D |
Table 4-5 Pin FMA for Device Pins Short-Circuited to Supply
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| CH 4 IN/OUT | 1 | Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| CH 6 IN/OUT | 2 | Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| COM OUT/IN | 3 | Corruption of the signal passed onto the CHx IN/OUT pins. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| CH 7 IN/OUT | 4 | Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| CH 5 IN/OUT | 5 | Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| INH | 6 | INH stuck high. Can no longer enable the device. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. | A |
| VEE | 7 | Device is unpowered. Device is not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. | A |
| VSS | 8 | Device is unpowered. Device is not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. | A |
| C | 9 | Address stuck high. Cannot control switch states. | B |
| B | 10 | Address stuck high. Cannot control switch states. | B |
| A | 11 | Address stuck high. Cannot control switch states. | B |
| CH 3 IN/OUT | 12 | Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| CH 0 IN/OUT | 13 | Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| CH 1 IN/OUT | 14 | Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| CH 2 IN/OUT | 15 | Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| VDD | 16 | No effect. Normal operation. | D |
Table 4-6 Pin FMA for Device Pins Short-Circuited to VEE
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| CH 4 IN/OUT | 1 | Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| CH 6 IN/OUT | 2 | Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| COM OUT/IN | 3 | Corruption of the signal passed onto the CHx IN/OUT pins. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| CH 7 IN/OUT | 4 | Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| CH 5 IN/OUT | 5 | Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| INH | 6 | Possible damage to the device if signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. | A |
| VEE | 7 | No effect. Normal operation. | D |
| VSS | 8 | Possible damage to the device if signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. | A |
| C | 9 | Possible damage to the device if signal voltage is negative. Cannot control switch states. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. | A |
| B | 10 | Possible damage to the device if signal voltage is negative. Cannot control switch states. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. | A |
| A | 11 | Possible damage to the device if signal voltage is negative. Cannot control switch states. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. | A |
| CH 3 IN/OUT | 12 | Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| CH 0 IN/OUT | 13 | Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| CH 1 IN/OUT | 14 | Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| CH 2 IN/OUT | 15 | Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| VDD | 16 | Possible damage to the device if signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. | A |