SFFS006B November 2020 – March 2024 LMR33610 , LMR33620 , LMR33630 , LMR33640
1 Overview
This document contains information for LMR336x0 in the VQFN and HSOIC packages to aid in a functional safety system design. Information provided are:
- Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
- Component failure modes and their distribution (FMD) based on the primary function of the device
- Pin failure mode analysis (Pin FMA)
Figure 1-1 shows the device functional block diagram for reference.
Figure 1-1 Functional Block DiagramLMR336x0 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.