ZHCS221F April 2013 – January 2015 ISO7131CC , ISO7140CC , ISO7140FCC , ISO7141CC , ISO7141FCC
PRODUCTION DATA.
- 1 特性
- 2 應用范圍
- 3 說明
- 4 修訂歷史記錄
- 5 Pin Configuration and Functions
-
6 Specifications
- 6.1 Absolute Maximum Ratings
- 6.2 ESD Ratings
- 6.3 Recommended Operating Conditions
- 6.4 Thermal Information
- 6.5 Power Dissipation Ratings
- 6.6 Electrical Characteristics: VCC1 and VCC2 at 5 V ±10%
- 6.7 Electrical Characteristics: VCC1 and VCC2 at 3.3 V ±10%
- 6.8 Electrical Characteristics: VCC1 and VCC2 at 2.7 V
- 6.9 Switching Characteristics: VCC1 and VCC2 at 5 V ±10%
- 6.10 Switching Characteristics: VCC1 and VCC2 at 3.3 V ±10%
- 6.11 Switching Characteristics: VCC1 and VCC2 at 2.7 V
- 6.12 Supply Current: VCC1 and VCC2 at 5 V ±10%
- 6.13 Supply Current: VCC1 and VCC2 at 3.3 V ±10%
- 6.14 Supply Current: VCC1 and VCC2 at 2.7 V
- 6.15 Typical Characteristics
- 7 Parameter Measurement Information
- 8 Detailed Description
- 9 Application and Implementation
- 10Power Supply Recommendations
- 11Layout
- 12器件和文檔支持
- 13機械封裝和可訂購信息
7 Parameter Measurement Information
A. The input pulse is supplied by a generator having the following characteristics: PRR ≤ 50 kHz, 50% duty cycle, tr ≤ 3 ns, tf ≤ 3 ns, ZO = 50 Ω. At the input, a 50-Ω resistor is required to terminate the input-generator signal. It is not needed in an actual application.
B. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.
Figure 10. Switching-Characteristics Test Circuit and Voltage Waveforms
A. The input pulse is supplied by a generator having the following characteristics: PRR ≤ 50 kHz, 50% duty cycle, tr ≤ 3 ns, tf ≤ 3 ns, ZO = 50 Ω.
B. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.
Figure 11. Enable/Disable Propagation Delay-Time Test Circuit and Waveform
A. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.
Figure 12. Failsafe Delay-Time Test Circuit and Voltage Waveforms
A. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.
Figure 13. Common-Mode Transient Immunity Test Circuit